Evaluation of scanning capacitance microscopy sample preparation by focused ion beam. - Nicolas Rodriguez 001; Jérôme Adrian; Catherine Grosjean; Gérald Haller; Christophe Girardeaux; Alain Portavoce (Microelectron. Reliab., 2006)

Investigation of a new method for dopant characterization. - Jérôme Adrian; Nicolas Rodriguez 001; Fabien Essely; Gérald Haller; Catherine Grosjean; Alain Portavoce; Christophe Girardeaux (Microelectron. Reliab., 2007)

Leveraging Pre-trained Models for Failure Analysis Triplets Generation. - Kenneth Ezukwoke; Anis Hoayek; Mireille Batton-Hubert; Xavier Boucher; Pascal Gounet; Jérôme Adrian (CoRR, 2022)

Big GCVAE: decision-making with adaptive transformer model for failure root cause analysis in semiconductor industry. - Kenneth Ezukwoke; Anis Hoayek; Mireille Batton-Hubert; Xavier Boucher; Pascal Gounet; Jérôme Adrian (J. Intell. Manuf., 2025)