A mixed TCAD/Electrical simulation laboratory to open up the microelectronics teaching. - Jean-Marc Gallière; Jerome Boch (MSE, 2009)

A toolkit to demystify CMOS Active Pixel Sensors. - Jean-Marc Gallière; Jerome Boch (MSE, 2013)

Transient device simulation of neutron-induced failure in IGBT: A first step for developing a compact predictive model. - K. Guetarni; Antoine D. Touboul; Jerome Boch; L. Foro; A. Privat; Alain Michez; J.-R. Vaillé; Frédéric Saigné (Microelectron. Reliab., 2013)

Modeling dose effects in electronics devices: Dose and temperature dependence of power MOSFET. - Alain Michez; Jerome Boch; S. Dhombres; Frédéric Saigné; Antoine D. Touboul; J.-R. Vaillé; Laurent Dusseau; E. Lorfèvre; R. Ecoffet (Microelectron. Reliab., 2013)

A calculation method to estimate single event upset cross section. - Frederic Wrobel; Antoine D. Touboul; Vincent Pouget; Luigi Dilillo; Jerome Boch; Frédéric Saigné (Microelectron. Reliab., 2017)

Design and Implementation of a Flexible Interface for TID Detector. - Iacopo Fara; Lucas Matana Luza; Jérôme Boch; Gianluca Furano; Marco Ottavi; Luigi Dilillo (IWASI, 2019)

Evaluation and Analysis of Technologies for Robotic Platforms for the Nuclear Decommissioning. - Georgios Tsiligiannis; Antoine D. Touboul; Gaëtan Bricas; Tadec Maraine; Jerome Boch; Frederic Wrobel; Alain Michez; Frédéric Saigné; Alain Godot; Asenath Etile; Thibaud Durand; Romain Sueur; et al. (DTIS, 2020)