When Failure Analysis Meets Side-Channel Attacks. - Jerome Di-Battista; Jean-Christophe Courrège; Bruno Rouzeyre; Lionel Torres; Philippe Perdu (CHES, 2010)

VLSI functional analysis by dynamic emission microscopy. - Philippe Perdu; Jerome Di-Battista; Sylvain Dudit; Tomonori Nakamura (Microelectron. Reliab., 2010)