An efficient method for parametric yield optimization of MOS integrated circuits. - Tat-Kwan Yu; Sung-Mo Kang; Jerome Sacks; William J. Welch (ICCAD, 1989)

Software reliability model selection. - George J. Knafl; Jerome Sacks (COMPSAC, 1991)

Poisson processes with nearly constant failure intensity. - George J. Knafl; Jerome Sacks (ISSRE, 1991)

Parametric yield optimization of CMOS analogue circuits by quadratic statistical circuit performance models. - Tat-Kwan Yu; Sung-Mo Kang; Jerome Sacks; William J. Welch (Int. J. Circuit Theory Appl., 1991)

Integrated circuit design optimization using a sequential strategy. - Maria C. Bernardo; Robert J. Buck; Lihsin Liu; William A. Nazaret; Jerome Sacks; William J. Welch (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1992)

The Construction and Assessment of a Statistical Model for the Prediction of Protein Assay Data. - Jennifer Pittman; Jerome Sacks; S. Stanley Young (J. Chem. Inf. Comput. Sci., 2002)

Choosing the Sample Size of a Computer Experiment: A Practical Guide. - Jason L. Loeppky; Jerome Sacks; William J. Welch (Technometrics, 2009)

Comparison of Statistical and Deterministic Frameworks of Uncertainty Quantification. - Michael Frenklach; Andrew K. Packard; Gonzalo García-Donato; Rui Paulo; Jerome Sacks (SIAM/ASA J. Uncertain. Quantification, 2016)