Dynamic Analog Testing via ATE Digital Test Channels. - C. C. Su; C. S. Chang; H. W. Huang; D. S. Tu; C. L. Lee; Jerry C. H. Lin (Asian Test Symposium, 2004)

Exact pairwise error probability for block fading ofdm systems. - Jerry C. H. Lin; Andrej Stefanov (WCNC, 2006)

Cooperative Coding for OFDM Systems. - Jerry C. H. Lin; Andrej Stefanov (Wirel. Pers. Commun., 2007)