Electrical Characteristics and Testing Considerations for Gate Oxide Shorts in CMOS ICs. - Jerry M. Soden; Charles F. Hawkins (ITC, 1985)

Reliability and Electrical Properties of Gate Oxide Shorts in CMOS ICs. - Jerry M. Soden; Charles F. Hawkins (ITC, 1986)

Test Considerations for Gate Oxide Shorts in CMOS ICs. - Jerry M. Soden; Charles F. Hawkins (IEEE Des. Test, 1986)

CMOS IC Stuck-Open Fault Electrical Effects and Design Considerations. - Jerry M. Soden; R. Keith Treece; Michael R. Taylor; Charles F. Hawkins (ITC, 1989)

Increased CMOS IC stuck-at fault coverage with reduced I DDQ test sets. - Ronald R. Fritzemeier; Jerry M. Soden; R. Keith Treece; Charles F. Hawkins (ITC, 1990)

Zero defects or zero stuck-at faults-CMOS IC process improvement with IDDQ. - Jerry M. Soden; Ronald R. Fritzemeier; Charles F. Hawkins (ITC, 1990)

The Behavior and Testing Implications of CMOS IC Logic Gate Open Circuits. - Christopher L. Henderson; Jerry M. Soden; Charles F. Hawkins (ITC, 1991)

IDDQ testing: A review. - Jerry M. Soden; Charles F. Hawkins; Ravi K. Gulati; Weiwei Mao (J. Electron. Test., 1992)

Quality Testing Requires Quality Thinking. - Jerry M. Soden; Charles F. Hawkins (ITC, 1993)

IC failure analysis: techniques and tools for quality reliability improvement. - Jerry M. Soden; Richard E. Anderson 002 (Proc. IEEE, 1993)

Defect Classes - An Overdue Paradigm for CMOS IC. - Charles F. Hawkins; Jerry M. Soden; Alan W. Righter; F. Joel Ferguson (ITC, 1994)

IDDQ Design and Test Advantages Propel Industry. - Charles F. Hawkins; Jerry M. Soden (IEEE Des. Test Comput., 1995)

High Resolution IDDQ Characterization and Testing - Practical Issues. - Alan W. Righter; Jerry M. Soden; Richard W. Beegle (ITC, 1996)

IC Failure Analysis Tools and Techniques - Macig, Mystery, and Science. - Jerry M. Soden; Richard E. Anderson 002; Christopher L. Henderson (ITC, 1996)

IDDQ Testing: Issues Present and Future. - Jerry M. Soden; Charles F. Hawkins (IEEE Des. Test Comput., 1996)

Transient Power Supply Voltage (VDDT) Analysis for Detecting IC Defects. - Edward I. Cole Jr.; Jerry M. Soden; Paiboon Tangyunyong; Patrick L. Candelaria; Richard W. Beegle; Daniel L. Barton; Christopher L. Henderson; Charles F. Hawkins (ITC, 1997)

Signature Analysis for IC Diagnosis and Failure Analysis. - Christopher L. Henderson; Jerry M. Soden (ITC, 1997)

IC Diagnosis: Industry Issues. - Jerry M. Soden; Christopher L. Henderson (ITC, 1997)

IC Failure Analysis: Magic, Mystery, and Science. - Jerry M. Soden; Richard E. Anderson 002; Christopher L. Henderson (IEEE Des. Test Comput., 1997)

Still in the Stone Age? - Jerry M. Soden; Christopher L. Henderson (IEEE Des. Test Comput., 1997)

CMOS IC reliability indicators and burn-in economics. - Alan W. Righter; Charles F. Hawkins; Jerry M. Soden; Peter C. Maxwell (ITC, 1998)

Deep Submicron CMOS Current IC Testing: Is There a Future? - Charles F. Hawkins; Jerry M. Soden (IEEE Des. Test Comput., 1999)

Test and Reliability: Partners in IC Manufacturing, Part 2. - Charles F. Hawkins; Jaume Segura 001; Jerry M. Soden; Ted Dellin (IEEE Des. Test Comput., 1999)

Defect Oriented Fault Diagnosis for Semiconductor Memories using Charge Analysis: Theory and Experiments. - Ivan de Paúl; M. Rosales; Bartomeu Alorda; Jaume Segura 001; Charles F. Hawkins; Jerry M. Soden (VTS, 2001)

Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs. - Bartomeu Alorda; M. Rosales; Jerry M. Soden; Charles F. Hawkins; Jaume Segura 001 (ITC, 2002)

Parametric Failures in CMOS ICs - A Defect-Based Analysis. - Jaume Segura 001; Ali Keshavarzi; Jerry M. Soden; Charles F. Hawkins (ITC, 2002)