Comments on 'A compact thermal noise model for the investigation of soft error rates in MOS VLSI digital circuits'. - Jerzy F. Kolodziejski; Ludwik Spiralski (IEEE J. Solid State Circuits, 1990)

ESD Failures of Integrated Circuits and Their Diagnostics Using Transmission Line Pulsing. - Zbigniew Piatek; Jerzy F. Kolodziejski; Witold A. Pleskacz (DDECS, 2007)