Fault localisation of defects using Electro Optical Terahertz Pulse Reflectometry and 3D EM modelling with Virtual Known Good Device. - Emma Kowalczuk; Arnab Bhattacharya 007; Ka Chung Lee; Jesse Alton; Martin Igarashi; Stephane Barbeau (3DIC, 2014)

Electro Optical Terahertz Pulse Reflectometry, a non destructive technique to localize defects on various type of package. - Antoine Reverdy; M. Marchetti; Allesandra Fudoli; Alberto Pagani; V. Goubier; M. Cason; Jesse Alton; Martin Igarashi; G. Gibbons (Microelectron. Reliab., 2014)

Recent Developments in EOTPR Towards a Fully Automated Tool for High Volume Failure Analysis. - Tom White; Jesse Alton; Brett Gibson; Martin Igarashi; Joy Y. Liao; Timothy Pham; Howard L. Marks (IRPS, 2025)