Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs. - Wim Dobbelaere; Frederik Colle; Anthony Coyette; Ronny Vanhooren; Nektar Xama; Jhon Gomez; Georges G. E. Gielen (ITC, 2019)

Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing. - Anthony Coyette; Wim Dobbelaere; Ronny Vanhooren; Nektar Xama; Jhon Gomez; Georges G. E. Gielen (ETS, 2020)

Avoiding Mixed-Signal Field Returns by Outlier Detection of Hard-to-Detect Defects based on Multivariate Statistics. - Nektar Xama; Jakob Raymaekers; Martin Andraud; Jhon Gomez; Wim Dobbelaere; Ronny Vanhooren; Anthony Coyette; Georges G. E. Gielen (ETS, 2020)

Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs. - Stephen Sunter; Michal Wolinski; Anthony Coyette; Ronny Vanhooren; Wim Dobbelaere; Nektar Xama; Jhon Gomez; Georges G. E. Gielen (ITC, 2020)

Pinhole Latent Defect Modeling and Simulation for Defect-Oriented Analog/Mixed-Signal Testing. - Jhon Gomez; Nektar Xama; Anthony Coyette; Ronny Vanhooren; Wim Dobbelaere; Georges G. E. Gielen (VTS, 2020)

Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations. - Nektar Xama; Martin Andraud; Jhon Gomez; Baris Esen; Wim Dobbelaere; Ronny Vanhooren; Anthony Coyette; Georges G. E. Gielen (ACM Trans. Design Autom. Electr. Syst., 2020)

Recent Trends and Perspectives on Defect-Oriented Testing. - Paolo Bernardi; Riccardo Cantoro; Anthony Coyette; W. Dobbeleare; Moritz Fieback; Andrea Floridia; G. Gielenk; Jhon Gomez; Michelangelo Grosso; Andrea Guerriero; Iacopo Guglielminetti; Said Hamdioui; et al. (IOLTS, 2022)

DDtM: Increasing Latent Defect Detection in Analog/Mixed-Signal ICs Using the Difference in Distance to Mean Value. - Jhon Gomez; Nektar Xama; Anthony Coyette; Ronny Vanhooren; Wim Dobbelaere; Georges G. E. Gielen (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)

High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis. - Jhon Gomez; Nektar Xama; Anthony Coyette; Ronny Vanhooren; Wim Dobbelaere; Georges G. E. Gielen (ETS, 2023)

Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers. - Nektar Xama; Jhon Gomez; Wim Dobbelaere; Ronny Vanhooren; Anthony Coyette; Georges G. E. Gielen (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2023)