An efficient linearity test for on-chip high speed ADC and DAC using loop-back. - Ji Hwan (Paul) Chun; Hak-soo Yu; Jacob A. Abraham (ACM Great Lakes Symposium on VLSI, 2004)

Quasi-Oscillation Based Test for Improved Prediction of Analog Performance Parameters. - Ashwin Raghunathan; Ji Hwan (Paul) Chun; Jacob A. Abraham; Abhijit Chatterjee (ITC, 2004)

Performance Characterization of Mixed-Signal Circuits Using a Ternary Signal Representation. - Hak-soo Yu; Hongjoong Shin; Ji Hwan (Paul) Chun; Jacob A. Abraham (ITC, 2004)

Optimized Signature-Based Statistical Alternate Test for Mixed-Signal Performance Parameters. - Byoungho Kim; Hongjoong Shin; Ji Hwan (Paul) Chun; Jacob A. Abraham (ETS, 2006)

Predicting mixed-signal dynamic performance using optimised signature-based alternate test. - Byoungho Kim; Hongjoong Shin; Ji Hwan (Paul) Chun; Jacob A. Abraham (IET Comput. Digit. Tech., 2007)

A Random Jitter RMS Estimation Technique for BIST Applications. - Jae Wook Lee; Ji Hwan (Paul) Chun; Jacob A. Abraham (Asian Test Symposium, 2009)

A novel characterization technique for high speed I/O mixed signal circuit components using random jitter injection. - Ji Hwan (Paul) Chun; Jae Wook Lee; Jacob A. Abraham (ASP-DAC, 2010)

A delay measurement method using a shrinking clock signal. - Jae Wook Lee; Ji Hwan (Paul) Chun; Jacob A. Abraham (ACM Great Lakes Symposium on VLSI, 2010)

Indirect method for random jitter measurement on SoCs using critical path characterization. - Jae Wook Lee; Ji Hwan (Paul) Chun; Jacob A. Abraham (ETS, 2012)

Test of phase interpolators in high speed I/Os using a sliding window search. - Ji Hwan (Paul) Chun; Siew Mooi Lim; Shao Chee Ong; Jae Wook Lee; Jacob A. Abraham (VTS, 2012)