Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis. - Ken Chau-Cheung Cheng; Katherine Shu-Min Li; Andrew Yi-Ann Huang; Ji-Wei Li; Leon Li-Yang Chen; Nova Cheng-Yen Tsai; Sying-Jyan Wang; Chen-Shiun Lee; Leon Chou; Peter Yi-Yu Liao; Hsing-Chung Liang; Jwu E. Chen (DATE, 2020)