Magnetic Immunity Guideline for Embedded MRAM Reliability to Realize Mass Production. - Tae Young Lee; Kazutaka Yamane; Lee Yong Hau; Robin Chao; Nyuk Leong Chung; Vinayak Bharat Naik; K. Sivabalan; Jae Hyun Kwon; Jia Hao Lim; Wah-Peng Neo; Kevin Khua; Naganivetha Thiyagarajah; et al. (IRPS, 2020)

Extended MTJ TDDB Model, and Improved STT-MRAM Reliability With Reduced Circuit and Process Variabilities. - Vinayak Bharat Naik; J. H. Lim; Kazutaka Yamane; J. Kwon; Behin-Aein B.; N. L. Chung; S. K 001; R. Chao; C. Chiang; Y. Huang; L. Pu; Yuichi Otani; et al. (IRPS, 2022)