Effect of SiO2/Si interface roughness on gate current. - Lingfeng Mao 001; Yao Yang; Jian-Lin Wei; Heqiu Zhang; Mingzhen Xu; Changhua Tan (Microelectron. Reliab., 2001)

Power system aggregate load area modelling by particle swarm optimization. - Jian-Lin Wei; Jihong Wang 002; Q. H. Wu; Nan Lu (Int. J. Autom. Comput., 2005)