Jianfu Zhang
Orcid: 0000-0003-4987-6428Affiliations:
- Liverpool John Moores University, Department of Electronics and Electrical Engineering, UK
According to our database1,
Jianfu Zhang
authored at least 20 papers
between 2010 and 2023.
Collaborative distances:
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Bibliography
2023
Equiprobability-Based Local Response Surface Method for High-Sigma Yield Estimation With Both High Accuracy and Efficiency.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., April, 2023
Extracting statistical distributions of RTN originating from both acceptor-like and donor-like traps.
Proceedings of the 15th IEEE International Conference on ASIC, 2023
2022
Synaptic 1/f noise injection for overfitting suppression in hardware neural networks.
Neuromorph. Comput. Eng., 2022
2021
On the Accuracy in Modeling the Statistical Distribution of Random Telegraph Noise Amplitude.
IEEE Access, 2021
Investigation on the Implementation of Stateful Minority Logic for Future In-Memory Computing.
IEEE Access, 2021
Proceedings of the International Conference on IC Design and Technology, 2021
An integrated method for extracting the statistical distribution of RTN time constants.
Proceedings of the 14th IEEE International Conference on ASIC, 2021
True random number generator based on switching probability of volatile GeXSe1-X ovonic threshold switching selectors.
Proceedings of the 14th IEEE International Conference on ASIC, 2021
2020
An Assessment of the Statistical Distribution of Random Telegraph Noise Time Constants.
IEEE Access, 2020
A fast and test-proven methodology of assessing RTN/fluctuation on deeply scaled nano pMOSFETs.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
2019
Proceedings of the International Conference on IC Design and Technology, 2019
Proceedings of the 13th IEEE International Conference on ASIC, 2019
2018
As-grown-generation (AG) model of NBTI: A shift from fitting test data to prediction.
Microelectron. Reliab., 2018
2017
Hot carrier aging of nano-scale devices: Characterization method, statistical variation, and their impact on use voltage.
Proceedings of the 12th IEEE International Conference on ASIC, 2017
2015
Proceedings of the IEEE International Reliability Physics Symposium, 2015
Proceedings of the 2015 IEEE 11th International Conference on ASIC, 2015
2014
Optimization of inter-gate-dielectrics in hybrid float gate devices to reduce window instability during memory operations.
Microelectron. Reliab., 2014
Microelectron. Reliab., 2014
2010
NBTI degradation effect on advanced-process 45 nm high-k PMOSFETs with geometric and process variations.
Microelectron. Reliab., 2010