NBTI degradation effect on advanced-process 45 nm high-k PMOSFETs with geometric and process variations. - Sharifah Wan Muhamad Hatta; Norhayati Soin; D. Abd Hadi; Jianfu Zhang 001 (Microelectron. Reliab., 2010)

Energy distribution of positive charges in high-k dielectric. - Sharifah Wan Muhamad Hatta; Zhigang Ji; Jianfu Zhang 001; Weidong Zhang 002; Norhayati Soin; Ben Kaczer; Stefan De Gendt; Guido Groeseneken (Microelectron. Reliab., 2014)

Optimization of inter-gate-dielectrics in hybrid float gate devices to reduce window instability during memory operations. - Baojun Tang; Weidong Zhang 002; Laurent Breuil; Colin Robinson; Yunqi Wang; Maria Toledano-Luque; Geert Van den Bosch; Jianfu Zhang 001; Jan Van Houdt (Microelectron. Reliab., 2014)

NBTI prediction and its induced time dependent variation. - Jianfu Zhang 001; Meng Duan; Zhigang Ji; Weidong Zhang 002 (ASICON, 2015)

ESD characterization of planar InGaAs devices. - Zhigang Ji; Dimitri Linten; Roman Boschke; Geert Hellings; S. H. Chen; AliReza Alian; D. Zhou; Yves Mols; Tsvetan Ivanov; Jacopo Franco; Ben Kaczer; X. Zhang; et al. (IRPS, 2015)

Hot carrier aging of nano-scale devices: Characterization method, statistical variation, and their impact on use voltage. - Jianfu Zhang 001; Meng Duan; Zhigang Ji; Weidong Zhang 002 (ASICON, 2017)

As-grown-generation (AG) model of NBTI: A shift from fitting test data to prediction. - Jianfu Zhang 001; Zhigang Ji; Wei Dong Zhang 002 (Microelectron. Reliab., 2018)

An assessment of RTN-induced threshold voltage jitter. - Jianfu Zhang 001; Azrif Manut; Rui Gao 003; Mehzabeen Mehedi; Zhigang Ji; Weidong Zhang 002; John S. Marsland (ASICON, 2019)

Voltage step stress: a technique for reducing test time of device ageing. - Jian Fu Zhang 001; Zhigang Ji; Meng Duan; Wei Dong Zhang 002; Cezhou Zhao (ICICDT, 2019)

A fast and test-proven methodology of assessing RTN/fluctuation on deeply scaled nano pMOSFETs. - Rui Gao 003; Mehzabeen Mehedi; Haibao Chen; Xinsheng Wang; Jianfu Zhang 001; Xiaoling Lin; Zhiyuan He; Yiqiang Chen 002; Dengyun Lei; Yun Huang; Yunfei En; Zhigang Ji; et al. (IRPS, 2020)

An Assessment of the Statistical Distribution of Random Telegraph Noise Time Constants. - Mehzabeen Mehedi; Kean Hong Tok; Jianfu Zhang 001; Zhigang Ji; Zengliang Ye; Weidong Zhang 002; John S. Marsland (IEEE Access, 2020)

True random number generator based on switching probability of volatile GeXSe1-X ovonic threshold switching selectors. - Zheng Chai; Pedro Freitas; Weidong Zhang 002; Jian Fu Zhang 001; John S. Marsland (ASICON, 2021)

An integrated method for extracting the statistical distribution of RTN time constants. - Mehzabeen Mehedi; Kean Hong Tok; Jian Fu Zhang 001; Zhigang Ji; Zengliang Ye; Weidong Zhang 002; John S. Marsland (ASICON, 2021)

Understanding Generated RTN as an Entropy Source for True Random Number Generators. - Zhigang Ji; Jianfu Zhang 001 (ICICDT, 2021)

Investigation on the Implementation of Stateful Minority Logic for Future In-Memory Computing. - Chunyang Liu; Pengpeng Ren; Bo Zhou 001; Jianfu Zhang 001; Hui Fang 003; Zhigang Ji (IEEE Access, 2021)

On the Accuracy in Modeling the Statistical Distribution of Random Telegraph Noise Amplitude. - Mehzabeen Mehedi; Kean Hong Tok; Zengliang Ye; Jianfu Zhang 001; Zhigang Ji; Weidong Zhang 002; John S. Marsland (IEEE Access, 2021)

Synaptic 1/f noise injection for overfitting suppression in hardware neural networks. - Yan Du; Wei Shao 006; Zheng Chai; Hanzhang Zhao; Qihui Diao; Yawei Gao; Xihui Yuan; Qiaoqiao Wang; Tao Li; Weidong Zhang 002; Jian Fu Zhang 001; Tai Min (Neuromorph. Comput. Eng., 2022)

Stochastic Computing Based on Volatile Ovonic Threshold Switching Devices. - Zheng Chai; Weidong Zhang 002; Jian Fu Zhang 001 (ASICON, 2023)

Extracting statistical distributions of RTN originating from both acceptor-like and donor-like traps. - Kean Hong Tok; Jian Fu Zhang 001; James Brown; Zhigang Ji; Weidong Zhang 002 (ASICON, 2023)

A Pragmatic Model to Predict Future Device Aging. - James Brown; Kean Hong Tok; Rui Gao 003; Zhigang Ji; Weidong Zhang 002; John S. Marsland; Thomas Chiarella; Jacopo Franco; Ben Kaczer; Dimitri Linten; Jianfu Zhang 001 (IEEE Access, 2023)

Equiprobability-Based Local Response Surface Method for High-Sigma Yield Estimation With Both High Accuracy and Efficiency. - Xiang Liu; Pengpeng Ren; Hai-Bao Chen; Zhigang Ji; Junhua Liu; Runsheng Wang; Jianfu Zhang 001; Ru Huang 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2023)