Reliability study of package-on-package stacking assembly under vibration loading. - Jiang Xia; LanXian Cheng; Guoyuan Li; Bin Li 007 (Microelectron. Reliab., 2017)

Fatigue life prediction of Package-on-Package stacking assembly under random vibration loading. - Jiang Xia; Guoyuan Li; Bin Li 007; LanXian Cheng; Bin Zhou (Microelectron. Reliab., 2017)