A Low-Delay Quadruple-Node-Upset Self-Recoverable Latch Design. - Shuo Cai; Jiangbiao Ouyang; Yan Wen; Weizheng Wang 002; Fei Yu 009 (ATS, 2023)

A highly reliable and low-power cross-coupled 18T SRAM cell. - Shuo Cai; Yan Wen; Jiangbiao Ouyang; Weizheng Wang 002; Fei Yu 009; Bo Li 051 (Microelectron. J., 2023)