Dielectric charging induced drift in micro device reliability-a review. - Wu Zhou 003; Jiangbo He; Xiao-Ping He; Huijun Yu; Bei Peng 002 (Microelectron. Reliab., 2016)

Structural Designing of a MEMS Capacitive Accelerometer for Low Temperature Coefficient and High Linearity. - Jiangbo He; Wu Zhou 003; Huijun Yu; Xiao-Ping He; Peng Peng (Sensors, 2018)

Drift of MEMS Closed-Loop Accelerometers Induced by Dielectric Charging. - Jiangbo He; Wu Zhou 003; Xiaoping He; Huijun Yu; Longqi Ran (IEEE Trans. Instrum. Meas., 2021)

An Improved SOI-on-Glass Fabrication Method of Large-Area Sheeting of MEMS Isolator. - Longqi Ran; Yichuan Wu; Jiangbo He; Binlei Cao; Zongda Hu; Wu Zhou 003 (NEMS, 2023)