A Method of Predicting the Deposited Film Thickness in IC Fabrication Based on Stacking Ensemble Learning. - Jiangchen Wu; Yumeng Shi; Yining Chen (CSAI, 2023)

SPPE-GAN: A novel model for Die-to-Database alignment and SEM distortion correction framework. - Yuping Wang; Yining Chen; Jiangchen Wu (Expert Syst. Appl., 2025)