A Temperature-Aware Reliability Enhancement Strategy for 3-D Charge-Trap Flash Memory. - Yi Wang 003; Jiangfan Huang; Jing Yang 018; Tao Li 006 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019)

PVSensing: A Process-Variation-Aware Space Allocation Strategy for 3D NAND Flash Memory. - Yi Wang 003; Jiangfan Huang; Jing Chen; Rui Mao 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)