Characterization and reliability of III-V gate-all-around MOSFETs. - Mengwei Si; SangHoon Shin; Nathan J. Conrad; Jiangjiang Gu; Jingyun Zhang; Muhammad Ashraful Alam; Peide D. Ye (IRPS, 2015)

Nitrogen-Doped Carbon Dots as A New Substrate for Sensitive Glucose Determination. - Hanxu Ji; Feng Zhou; Jiangjiang Gu; Chen Shu; Kai Xi; Xudong Jia (Sensors, 2016)