Surrogating circuit design solutions with robustness metrics. - Jin Sun 006; Liang Xiao 001; Jiangshan Tian; He Zhou; Janet Roveda (Integr., 2016)

An efficient bi-objective optimization framework for statistical chip-level yield analysis under parameter variations. - Xin Li 070; Jin Sun 001; Fu Xiao 001; Jiangshan Tian (Frontiers Inf. Technol. Electron. Eng., 2016)