Investigation of STI edge effect on programming disturb in localized charge trapping SONOS flash memory cells. - Yue Xu; Feng Yan 002; ZhiGuo Li; Fan Yang; Jianguang Chang; Yonggang Wang (Microelectron. Reliab., 2012)

The promising multi-bit/level programming operations for nano-scaled SONOS memory. - Xiaoli Ji; Chun-bo Wu; Yue Xu; Yi-ming Liao; Jianguang Chang; Li-juang Ma; Feng Yan 002 (Microelectron. Reliab., 2014)