Process variation dependence of total ionizing dose effects in bulk nFinFETs. - Bo Li 051; Yunbo Huang; Ling Yang; Qingzhu Zhang; Zhongshan Zheng; Binhong Li; Huiping Zhu; Jianhui Bu; Huaxiang Yin; Jiajun Luo; Zhengsheng Han; Haibin Wang (Microelectron. Reliab., 2018)

Multi-task Sentence Encoding Model for Semantic Retrieval in Question Answering Systems. - Qiang Huang; Jianhui Bu; Weijian Xie; Shengwen Yang; Weijia Wu; Liping Liu (IJCNN, 2019)

Influence of Back Gate Bias on the Hot Carrier Reliability of DSOI nMOSFET. - Xinyi Zhang; Kewei Wang 007; Fang Wang; Jiangjiang Li; Zhicheng Wu; Duoli Li; Bo Li; Jianhui Bu; Zhengsheng Han (IRPS, 2023)