Fault isolation in semiconductor product, process, physical and package failure analysis: Importance and overview. - Jiann Min Chin; Vinod Narang; Xiaole Zhao; Meng Yeow Tay; Angeline Phoa; Venkat Ravikumar; Lwin Hnin Ei; Soon Huat Lim; Chea Wei Teo; Syahirah Zulkifli; Mei Chyn Ong; Ming Chuan Tan (Microelectron. Reliab., 2011)

Understanding spatial resolution of laser voltage imaging. - Venkat Krishnan Ravikumar; Gabriel Lim; Jiann Min Chin; Kin Leong Pey; Joel K. W. Yang (Microelectron. Reliab., 2018)