A new via chain design method considering confidence level and estimation precision. - Xiao-hua Luo; Li-sheng Chen; Jiao-jiao Zhu; Xiaolang Yan (J. Zhejiang Univ. Sci. C, 2012)

Scratch-concerned yield modeling for IC manufacturing involved with a chemical mechanical polishing process. - Jiao-jiao Zhu; Xiao-hua Luo; Li-sheng Chen; Yi Ye; Xiaolang Yan (J. Zhejiang Univ. Sci. C, 2012)

Novel serpentine structure design method considering confidence level and estimation precision. - Li-sheng Chen; Xiao-hua Luo; Jiao-jiao Zhu; Fan-chao Jie; Xiaolang Yan (J. Zhejiang Univ. Sci. C, 2013)