Automated Visual Defect Classification for Flat Steel Surface: A Survey. - Qiwu Luo; Xiaoxin Fang; Jiaojiao Su; Jian Zhou; Bingxing Zhou; Chunhua Yang 001; Li Liu 002; Weihua Gui 001; Lu Tian (IEEE Trans. Instrum. Meas., 2020)

Smoothing Complete Feature Pyramid Networks for Roll Mark Detection of Steel Strips. - Qiwu Luo; Weiqiang Jiang; Jiaojiao Su; Jiaqiu Ai; Chunhua Yang 001 (Sensors, 2021)

Waterdrop Removal From Hot-Rolled Steel Strip Surfaces Based on Progressive Recurrent Generative Adversarial Networks. - Qiwu Luo; Kexin Liu; Jiaojiao Su; Chunhua Yang 001; Weihua Gui 001; Li Liu 002; Olli Silvén (IEEE Trans. Instrum. Meas., 2021)

Compact and Efficient Feature Representation for Defect in hot rolled strip steel: A postion paper. - Jiaojiao Su; Qiwu Luo; Chunhua Yang 001 (ASCC, 2022)

Scale-selective and noise-robust extended local binary pattern for texture classification. - Qiwu Luo; Jiaojiao Su; Chunhua Yang 001; Olli Silvén; Li Liu 002 (Pattern Recognit., 2022)

CAT-EDNet: Cross-Attention Transformer-Based Encoder-Decoder Network for Salient Defect Detection of Strip Steel Surface. - Qiwu Luo; Jiaojiao Su; Chunhua Yang 001; Weihua Gui 001; Olli Silvén; Li Liu 002 (IEEE Trans. Instrum. Meas., 2022)

CDDNet: Camouflaged Defect Detection Network for Steel Surface. - Qiwu Luo; Ben Li; Jiaojiao Su; Chunhua Yang 001; Weihua Gui 001; Olli Silvén; Li Liu 002 (IEEE Trans. Instrum. Meas., 2024)

I²GF-Net: Interlayer Information Guidance Feedback Networks for Wood Surface Defect Detection in Complex Texture Backgrounds. - Qiwu Luo; Wenlong Xu; Jiaojiao Su; Chunhua Yang 001; Weihua Gui 001; Olli Silvén; Li Liu 002 (IEEE Trans. Instrum. Meas., 2024)

PMSA-DyTr: Prior-Modulated and Semantic-Aligned Dynamic Transformer for Strip Steel Defect Detection. - Jiaojiao Su; Qiwu Luo; Chunhua Yang 001; Weihua Gui 001; Olli Silvén; Li Liu 002 (IEEE Trans. Ind. Informatics, 2024)

Efficient Adaptation of Visual Foundation Models for Wood Defect Segmentation via Instance Linking and Feature Disentanglement. - Qiwu Luo; Wenlong Xu; Jiaojiao Su; Chunhua Yang 001; Weihua Gui 001; Olli Silvén (IEEE Trans. Instrum. Meas., 2025)