Test Data Compression for System-on-a-Chip using Count Compatible Pattern Run-Length Coding. - Haiying Yuan; Jiaping Mei; Hongying Song; Kun Guo 006 (J. Electron. Test., 2014)

A Power Efficient BIST TPG Method on Don't Care Bit Based 2-D Adjusting and Hamming Distance Based 2-D Reordering. - Haiying Yuan; Kun Guo 006; Xun Sun; Jiaping Mei; Hongying Song (J. Electron. Test., 2015)

A Power Efficient Test Data Compression Method on Count Compatible PRL Coding. - Haiying Yuan; Jiaping Mei; Xun Sun; K. T. Cheng; Kun Guo 006 (J. Circuits Syst. Comput., 2015)