A new pre-driver design for improving the ESD performance of the high voltage tolerant I/O. - Jian-Hsing Lee; Jiaw-Ren Shih; Yi-Hsun Wu; Kuo-Feng Yu; Tong-Chern Ong (ISCAS (2), 2005)

A Statistical Learning Model for Accurate Prediction of Time-Dependent Dielectric Degradation for Low Failure Rates. - Kaustubh Joshi 003; Yung-Huei Lee; Yu-Cheng Yao; Shu-Wen Chang; Siao-Syong Bian; P. J. Liao; Jiaw-Ren Shih; Min-Jan Chen (IRPS, 2019)