Time-Variant Reliability Optimization for Stress Balance in Press-Pack Insulated Gate Bipolar Transistors. - Hangyang Li; Tongguang Yang; Xinglin Liu; Jingyi Zhong; Jiaxin Mo; Han Zhou; Zhongkun Xiao (IEEE Access, 2023)

Synchronous Multisurface Interferometry Based on Rotational Invariance Under Nonfull-Period Sampling. - Yonghao Zhou; Leyuan Peng; Jiaxin Mo; Yingjie Yu (IEEE Trans. Instrum. Meas., 2025)