On Optimizing Fault Coverage, Pattern Count, and ATPG Run Time Using a Hybrid Single-Capture Scheme for Testing Scan Designs. - Shianling Wu; Laung-Terng Wang; Zhigang Jiang; Jiayong Song; Boryau Sheu; Xiaoqing Wen; Michael S. Hsiao; James Chien-Mo Li; Jiun-Lang Huang; Ravi Apte (DFT, 2008)