Large-tilt Heavy Ions Induced SEU in Multiple Radiation Hardened 22 nm FDSOI SRAMs. - Chang Cai; Tianqi Liu; Jie Liu 032; Gengsheng Chen; Luchang Ding; Kai Zhao; Bingxu Ning; Mingjie Shen (IRPS, 2020)

Characterization of Heavy Ion Induced SET Features in 22-nm FD-SOI Testing Circuits. - Chang Cai; Ze He; Tianqi Liu; Gengsheng Chen; Jian Yu; Liewei Xu; Jie Liu 032 (IEEE Access, 2020)

Characterization and Classification of Heavy Ion Induced Failures in FPGA-based Logical Circuits. - Shuai Gao; Chang Cai; Bingxu Ning; Ze He; Jie Liu 032 (ASICON, 2021)

SEU sensitivity and large spacing TMR efficiency of Kintex-7 and Virtex-7 FPGAs. - Chang Cai; Bingxu Ning; Xue Fan; Tianqi Liu; Lingyun Ke; Gengsheng Chen; Jian Yu; Ze He; Liewei Xu; Jie Liu 032 (Sci. China Inf. Sci., 2022)