A Robust Space Target Detection Algorithm Based on Target Characteristics. - Bin Lin; Xia Yang; Jie Wang 142; Yangyang Wang; Kunpeng Wang; Xiaohu Zhang (IEEE Geosci. Remote. Sens. Lett., 2022)

A Hybrid Deep Learning-Based Framework for Chip Packaging Fault Diagnostics in X-Ray Images. - Jie Wang 142; Gaomin Li; Haoyu Bai; Guixin Yuan; Xuan Li; Bin Lin; Lijun Zhong; Xiaohu Zhang (IEEE Trans. Ind. Informatics, 2024)