Trap generation and breakdown processes in very thin gate oxides. - Elyse Rosenbaum; Jie Wu 009 (Microelectron. Reliab., 2001)

Breakdown and latent damage of ultra-thin gate oxides under ESD stress conditions. - Jie Wu 009; Patrick Juliano; Elyse Rosenbaum (Microelectron. Reliab., 2001)

Degradation and Breakdown of Ultrathin Gate Oxide - Jie Wu 009 (2001)