A cost-driven lithographic correction methodology based on off-the-shelf sizing tools. - Puneet Gupta 001; Andrew B. Kahng; Dennis Sylvester; Jie Yang 010 (DAC, 2003)

Toward a methodology for manufacturability-driven design rule exploration. - Luigi Capodieci; Puneet Gupta 001; Andrew B. Kahng; Dennis Sylvester; Jie Yang 010 (DAC, 2004)

Advanced timing analysis based on post-OPC extraction of critical dimensions. - Jie Yang 010; Luigi Capodieci; Dennis Sylvester (DAC, 2005)

Performance Driven OPC for Mask Cost Reduction. - Puneet Gupta 001; Andrew B. Kahng; Dennis Sylvester; Jie Yang 010 (ISQED, 2005)

An up-stream design auto-fix flow for manufacturability enhancement. - Jie Yang 010; Ethan Cohen; Cyrus Tabery; Norma Rodriguez; Mark Craig (DAC, 2006)