DCScan: A Power-Aware Scan Testing Architecture. - Gui Dai; Zhiqiang You; Jishun Kuang; Jiedi Huang (ATS, 2008)

Capture in Turn Scan for Reduction of Test Data Volume, Test Application Time and Test Power. - Zhiqiang You; Jiedi Huang; Michiko Inoue; Jishun Kuang; Hideo Fujiwara (Asian Test Symposium, 2010)