Seal Integrity Testing Utilizing Non-Destructive Capacitive Sensing for Product Packaging Assurance. - Jieming Pan; Yida Li; Yuxuan Luo; Xiangyu Zhang; Zaifeng Yang; David Liang Tai Wong; Jessie Xuhua Niu; Chen-Khong Tham; Aaron Voon-Yew Thean (IEEE SENSORS, 2020)

A Wireless Multi-Channel Capacitive Sensor System for Efficient Glove-Based Gesture Recognition With AI at the Edge. - Jieming Pan; Yuxuan Luo; Yida Li; Chen-Khong Tham; Chun-Huat Heng; Aaron Voon-Yew Thean (IEEE Trans. Circuits Syst. II Express Briefs, 2020)

Significance of activation functions in developing an online classifier for semiconductor defect detection. - Md Meftahul Ferdaus; Bangjian Zhou; Ji Wei Yoon; Kain Lu Low; Jieming Pan; Joydeep Ghosh; Min Wu 008; Xiaoli Li 001; Aaron Voon-Yew Thean; J. Senthilnath 001 (Knowl. Based Syst., 2022)

Quantile Online Learning for Semiconductor Failure Analysis. - Bangjian Zhou; Jieming Pan; Maheswari Sivan; Aaron Voon-Yew Thean; J. Senthilnath 001 (ICASSP, 2023)