Delay Monitoring Under Different PVT Corners for Test and Functional Operation. - Hari Addepalli; Jiezhong Wu; Nilanjan Mukherjee 001; Irith Pomeranz; Janusz Rajski (ITC, 2024)

Timing-Verification Test Generation Targeting Small Delay Defects. - Jiezhong Wu; Nilanjan Mukherjee 001; Irith Pomeranz; Kun-Han Tsai; Janusz Rajski (VTS, 2025)