Transistor reliability characterization and modeling of the 22FFL FinFET technology. - Chen-Yi Su; M. Armstrong; Lei Jiang; S. A. Kumar; C. D. Landon; S. Liu; Inanc Meric; K. W. Park; Leif Paulson; K. Phoa; Bernhard Sell; Jihan Standfest; et al. (IRPS, 2018)

Novel Re-configurable Circuits For Aging Characterization: Connecting Devices to Circuits. - Ketul B. Sutaria; Jihan Standfest; Inanc Meric; Amirhossein H. Davoody; Swaroop Kumar Namalapuri; Trinadh Mutyala; Supriya P.; Balkaran Gill; Stephen Ramey; Jeffery Hicks (IRPS, 2020)

Q&R On-Chip (QROC): A Unified, Oven-less and Scalable Circuit Reliability Platform. - Ketul B. Sutaria; Minki Cho; Anisur Rahman; Jihan Standfest; Rahul Sharma; Swaroop Kumar Namalapuri; Shiv Gupta; Bahar Ajdari; Ricardo Ascázubi; Balkaran Gill (IRPS, 2022)

A Unified Aging Model Framework Capturing Device to Circuit Degradation for Advance Technology Nodes. - S. Mukhopadhyay; C. Chen; M. Jamil; Jihan Standfest; Inanc Meric; Balkaran Gill; Stephen Ramey (IRPS, 2023)