Load Matrix Optimization in Mobile Cellular Networks. - Jihun Jung; Mohammad Abaii; Rahim Tafazolli (VTC Spring, 2008)

Efficient Use of Unused Spare Columns to Improve Memory Error Correcting Rate. - Umair Ishaq; Jihun Jung; Jaehoon Song; Sungju Park (Asian Test Symposium, 2011)

Scan-Puf: Puf Elements Selection Methods for Viable IC Identification. - Dooyoung Kim; Muhammad Adil Ansari; Jihun Jung; Sungju Park (ATS, 2015)

Efficient diagnosis technique for aging defects on automotive semiconductor chips. - Jihun Jung; Muhammad Adil Ansari; Dooyoung Kim; Hyunbean Yi; Sungju Park (ETS, 2015)

Time-multiplexed test access architecture for stacked integrated circuits. - Muhammad Adil Ansari; Jihun Jung; Dooyoung Kim; Sungju Park (IEICE Electron. Express, 2016)

ResNet-Based Vehicle Classification and Localization in Traffic Surveillance Systems. - Heechul Jung; Min-Kook Choi; Jihun Jung; Jin-Hee Lee; Soon Kwon; Woo Young Jung (CVPR Workshops, 2017)

On Diagnosing the Aging Level of Automotive Semiconductor Devices. - Jihun Jung; Muhammad Adil Ansari; Dooyoung Kim; Hyunbean Yi; Sungju Park (IEEE Trans. Circuits Syst. II Express Briefs, 2017)

Co-Occurrence Matrix Analysis-Based Semi-Supervised Training for Object Detection. - Min-Kook Choi; Jaehyeong Park; Jihun Jung; Heechul Jung; Jin-Hee Lee; Woong-Jae Won; Woo Young Jung; Jincheol Kim; Soon Kwon (ICIP, 2018)

Framework for Evaluating Vision-based Autonomous Steering Control Model. - Soon Kwon; Jaehyeong Park; Heechul Jung; Jihun Jung; Min-Kook Choi; Iman Rahmansyah Tayibnapis; Jin-Hee Lee; Woong-Jae Won; Sung-Hoon Youn; Kwang-Hoe Kim; Tae Hun Kim (ITSC, 2018)

Time-Multiplexed 1687-Network for Test Cost Reduction. - Muhammad Adil Ansari; Jihun Jung; Dooyoung Kim; Sungju Park (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018)

Erratum to "Time-Multiplexed-Network for Test Cost Reduction". - Muhammad Adil Ansari; Jihun Jung; Dooyoung Kim; Sungju Park (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018)

CAN-Based Aging Monitoring Technique for Automotive ASICs With Efficient Soft Error Resilience. - Jinuk Kim; Muhammad Ibtesam; Dooyoung Kim; Jihun Jung; Sungju Park (IEEE Access, 2020)