Reliability Impacts of Tapered Nanosheets and Localized Layout Effects in MBCFETs Fabricated with 2NM Logic Technology Featuring GAA. - Seongkyung Kim; Eunyu Choi; Jinyoung Kim; Junkyo Jeong; Jihun Ryu; Myungsoo Yeo; Taiki Uemura; Shin-Young Chung; Jong-Ho Lee (IRPS, 2025)