An Efficient On-Line Monitoring BIST for Remote Service System. - Sangmin Bae; DongSup Song; Jihye Kim 002; Sungho Kang 001 (AISA, 2002)

Test Compression Improvement with EDT Channel Sharing in SoC Designs. - Yu Huang 005; Mark Kassab; Jay Jahangiri; Janusz Rajski; Wu-Tung Cheng; Dongkwan Han; Jihye Kim 002; Kun Young Chung (NATW, 2014)

A New Scan Chain Reordering Method for Low Power Consumption based on Care Bit Density. - Kyunghwan Cho; Jihye Kim 002; Hyunggoy Oh; Sangjun Lee; Sungho Kang 001 (ISOCC, 2019)

Transition-delay Test Methodology for Designs with Self-gating. - Jihye Kim 002; Sangjun Lee; Minho Moon; Sungho Kang 001 (ISOCC, 2019)

Test-Friendly Data-Selectable Self-Gating (DSSG). - Jihye Kim 002; Sangjun Lee; Sungho Kang 001 (IEEE Trans. Very Large Scale Integr. Syst., 2019)

Memory-like Defect Diagnosis for CMOL FPGAs. - Jihye Kim 002; Hayoung Lee; Seokjun Jang; Hogyeong Kim; Sungho Kang 001 (ISOCC, 2020)

Fine-Grained Defect Diagnosis for CMOL FPGA Circuits. - Jihye Kim 002; Hayoung Lee; Seokjun Jang; Sungho Kang 001 (IEEE Access, 2020)

Reconfigurable Scan Architecture for High Diagnostic Resolution. - Seokjun Jang; Jihye Kim 002; Sungho Kang 001 (IEEE Access, 2021)

Low-Power Scan Correlation-Aware Scan Cluster Reordering for Wireless Sensor Networks. - Sangjun Lee; Kyunghwan Cho; Jihye Kim 002; Jongho Park; Inhwan Lee; Sungho Kang 001 (Sensors, 2021)

ZOS: Zero Overhead Scan for Systolic Array-based AI accelerator. - Jihye Kim 002; Hayoung Lee; Jongho Park; Sungho Kang 001 (ISOCC, 2022)

STRAIT: Self-Test and Self-Recovery for AI Accelerator. - Hayoung Lee; Jihye Kim 002; Jongho Park; Sungho Kang 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2023)