Enhanced analytic noise model for RF CMOS design. - Jim Koeppe; Ramesh Harjani (CICC, 2004)

Electronically programmable test points for on-chip analog/digital measurements. - Murillo Franco; Jairo Güiza; Erasmo Chiappetta; Sergio Rueda; H. Luis; J. Bertuzzo; Jim Koeppe; Tim Robins; Julian Jenkins; Tara Julia Hamilton (ISCAS, 2013)