Hierarchical extreme-voltage stress test of analog CMOS ICs for gate-oxide reliability enhancement. - Chin-Long Wey; Mohammad Athar Khalil; Jim Liu; Gregory Wierzba (ACM Great Lakes Symposium on VLSI, 2004)

On the feasibility of using servo-mechanisms in wireless multimedia sensor network deployments. - Damien O'Rourke; Raja Jurdak; Jim Liu; Darren Moore; Tim Wark (LCN, 2009)