Hot carrier and PBTI induced degradation in silicon nanowire gate-all-around SONOS MOSFETs. - Jin Hyung Choi; Jin-Woo Han; Chong-Gun Yu; Jong Tae Park 003 (Microelectron. Reliab., 2014)

Wire width dependence of hot carrier degradation in silicon nanowire gate-all-around MOSFETs. - Jin Hyung Choi; Jong Tae Park 003 (Microelectron. Reliab., 2015)

Nanowire width dependence of data retention and endurance characteristics in nanowire SONOS flash memory. - Jin Hyung Choi; Chong-Gun Yu; Jong Tae Park 003 (Microelectron. Reliab., 2016)