A Multi-step Approach for Identifying Unknown Defect Patterns on Wafer Bin Map. - Jin-Su Shin; Dong-Hee Lee (ICIEA-EU, 2024)

Similarity searching for wafer bin maps by measuring shape, location, and size similarities of defect patterns. - Min-Su Kang; Jin-Su Shin; Dong-Hee Lee (Comput. Ind. Eng., 2024)

A framework for detecting unknown defect patterns on wafer bin maps using active learning. - Jin-Su Shin; Min-Joo Kim; Dong-Hee Lee (Expert Syst. Appl., 2025)