Principal component analysis for errors-in-variables subspace identification. - Jin Wang 030; S. Joe Qin (CDC, 2001)

Closed-loop subspace identification using the parity space. - Jin Wang 030; Si-Zhao Joe Qin (Autom., 2006)

A General Framework for State Estimation in High-Mix Semiconductor Manufacturing. - Jin Wang 030; Q. Peter He; Thomas F. Edgar (ACC, 2007)

Run-to-run control and state estimation in high-mix semiconductor manufacturing. - Christopher A. Bode; Jin Wang 030; Q. Peter He; Thomas F. Edgar (Annu. Rev. Control., 2007)

Principal component based k-nearest-neighbor rule for semiconductor process fault detection. - Q. Peter He; Jin Wang 030 (ACC, 2008)

EWMA run-to-run controllers with gain updating: Stability and sensitivity analysis. - Jin Wang 030; Q. Peter He (ACC, 2008)

Comparison of a new spectrum alignment algorithm with other methods. - Q. Peter He; Jin Wang 030 (ACC, 2010)

Control performance assessment and diagnosis for semiconductor processes. - Jin Wang 030; Q. Peter He; Thomas F. Edgar (ACC, 2010)

Statistics pattern analysis based virtual metrology for plasma etch processes. - Q. Peter He; Jin Wang 030; Hector E. Gilicia; John D. Stuber; Bhalinder S. Gill (ACC, 2012)

Quantification of valve stiction based on a semi-physical model. - Q. Peter He; Jin Wang 030 (ACC, 2013)

Elucidating xylose metabolism of scheffersomyces stipitis by integrating principal component analysis with flux balance analysis. - Meng Liang; Q. Peter He; Thomas W. Jeffries; Jin Wang 030 (ACC, 2013)

Improved state estimation for high-mix semiconductor manufacturing. - Jin Wang 030; Q. Peter He; Thomas F. Edgar (ACC, 2013)

Statistical process monitoring in the era of smart manufacturing. - Q. Peter He; Jin Wang 030 (ACC, 2017)

A new application of data-driven soft sensor: Estimating individual biomass in mixed cultures. - Kyle A. Stone; Devarshi Shah; Q. Peter He; Jin Wang 030 (ACC, 2017)

Feature space monitoring for smart manufacturing via statistics pattern analysis. - Q. Peter He; Jin Wang 030; Devarshi Shah (Comput. Chem. Eng., 2019)

Next-generation virtual metrology for semiconductor manufacturing: A feature-based framework. - Kerul Suthar; Devarshi Shah; Jin Wang 030; Q. Peter He (Comput. Chem. Eng., 2019)

A Variable Selection Method for Improving Variable Selection Consistency and Soft Sensor Performance. - Jangwon Lee; Jesus Flores-Cerrillo; Jin Wang 030; Q. Peter He (ACC, 2020)

Using Channel State Information for Estimating Moisture Content in Woodchips via 5 GHz Wi-Fi. - Kerul Suthar; Jin Wang 030; Zhihua Jiang; Q. Peter He (ACC, 2020)

Bridging systems theory and data science: A unifying review of dynamic latent variable analytics and process monitoring. - Si-Zhao Joe Qin; Yining Dong; Qinqin Zhu; Jin Wang 030; Qiang Liu 018 (Annu. Rev. Control., 2020)

Feature engineering in big data analytics for IoT-enabled smart manufacturing - Comparison between deep learning and statistical learning. - Devarshi Shah; Jin Wang 030; Q. Peter He (Comput. Chem. Eng., 2020)

Understanding the evolution of interspecies metabolic interactions using dynamic genome-scale metabolic modeling*. - Kiumars Badr; Q. Peter He; Jin Wang 030 (ACC, 2022)