Characterization and analysis of gate-all-around Si nanowire transistors for extreme scaling. - Ru Huang 001; Runsheng Wang; Jing Zhuge; Changze Liu; Tao Yu; Liangliang Zhang; Xin Huang; Yujie Ai; Jinbin Zou; Yuchao Liu; Jiewen Fan; Huailin Liao; et al. (CICC, 2011)

HCI and NBTI induced degradation in gate-all-around silicon nanowire transistors. - Ru Huang 001; Runsheng Wang; Changze Liu; Liangliang Zhang; Jing Zhuge; Yu Tao; Jinbin Zou; Yuchao Liu; Yangyuan Wang (Microelectron. Reliab., 2011)

Speckle Noise Removal Based on Adaptive Total Variation Model. - Bo Chen 004; Jinbin Zou; Wensheng Chen; Xiangjun Kong; Jianhua Ma 001; Feng Li (PRCV (1), 2018)