Semantic Segmentation-Based Wafer Map Mixed-Type Defect Pattern Recognition. - Jinda Yan; Yi Sheng; Minghao Piao (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2023)

Image Hash Layer Triggered CNN Framework for Wafer Map Failure Pattern Retrieval and Classification. - Minghao Piao; Yi Sheng; Jinda Yan; Cheng Hao Jin (ACM Trans. Knowl. Discov. Data, 2024)

Multi-scale guidance diffusion network for wafer map defect recognition. - Zuxiang Long; Jinda Yan; Minghao Piao (Expert Syst. Appl., 2025)

Improved wafer map defect pattern classification using automatic data augmentation based lightweight encoder network in contrastive learning. - Yi Sheng; Jinda Yan; Minghao Piao (J. Intell. Manuf., 2025)