Signal Integrity Improvements of a MEMS Probe Card Using Back-Drilling and Equalizing Techniques. - Dong-Yeop Kim; Jindo Byun; Sang-Hoon Lee; Se-Jang Oh; Ki-Sang Kang; Hai-Young Lee (IEEE Trans. Instrum. Meas., 2011)

A 512Gb 3-bit/Cell 3D 6th-Generation V-NAND Flash Memory with 82MB/s Write Throughput and 1.2Gb/s Interface. - Dongku Kang; Minsu Kim 004; Suchang Jeon; Wontaeck Jung; Jooyong Park; Gyo Soo Choo; Dong-Kyo Shim; Anil Kavala; Seungbum Kim; Kyung-Min Kang; Jiyoung Lee; Kuihan Ko; et al. (ISSCC, 2019)

A 24Gb/s/pin PAM-4 Built Out Tester chip enabling PAM-4 chips test with NRZ interface ATE. - Hyungmin Jin; Jindo Byun; Hyunyoon Cho; Hojun Yoon; Jin-Hee Park; Kyoungsoo Kim; Youngdon Choi; Jung-Hwan Choi; Hyungjong Ko; Sang-Hyun Lee (A-SSCC, 2021)

A 3.2-12.8Gb/s Duty-Cycle Compensating Quadrature Error Corrector for DRAM Interfaces, With Fast Locking and Low Power Characteristics. - Hojun Yoon; Wonjoo Jung; Jaewoo Park; Jindo Byun; Hyungmin Jin; Hyunyoon Cho; Youngmin Kim; Baek-Jin Lim; Young-Chul Cho; Youngdon Choi; Jung-Hwan Choi; Hyungjong Ko; et al. (ESSCIRC, 2021)

A 60-Gb/s/pin single-ended PAM-4 transmitter with timing skew training and low power data encoding in mimicked 10nm class DRAM process. - Joohwan Kim; Junyoung Park; Jindo Byun; Changkyu Seol; Chang Soo Yoon; EunSeok Shin; Hyunyoon Cho; Youngdo Um; Sucheol Lee; Hyungmin Jin; Kwangseob Shin; Hyunsub Norbert Rie; et al. (CICC, 2022)

A 40-Gb/s/pin Low-Voltage POD Single-Ended PAM-4 Transceiver with Timing Calibrated Reset-less Slicer and Bidirectional T-Coil for GDDR7 Application. - Hyunsub Norbert Rie; Chang Soo Yoon; Jindo Byun; Sucheol Lee; Garam Kim; Joohwan Kim; Junyoung Park; Hyunyoon Cho; Youngdo Um; Hyungmin Jin; Kwangseob Shin; Minsu Jung; et al. (VLSI Technology and Circuits, 2022)

30.1 A 28Gb/mm24XX-Layer 1Tb 3b/Cell WF-Bonding 3D-NAND Flash with 5.6Gb/s/Pin IOs. - Sang-Soo Park; Jaedoeg Lyu; Myungjun Kim; Jaeyun Lee; Youngsun Song; Chungho Yu; Makoto Hirano; Yongseok Kwon; Jonghoon Park; Hojoon Kim; Daein Lee; Donghyun Seo; et al. (ISSCC, 2025)